Design and Testing of MEMS Component for Electromagnetic Pulse Protection

With the demand for high-safety, high-integration, and lightweight micro- and nano-electronic components, an MEMS electromagnetic energy-releasing component was innovatively designed based on the corona discharge theory. The device subverted the traditional device-level protection method for electro...

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Main Authors: Shiyi Li, Hengzhen Feng, Wenzhong Lou, Yuecen Zhao, Sining Lv, Wenxing Kan
Format: Article
Language:English
Published: MDPI AG 2025-01-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/25/1/221
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_version_ 1841548930356084736
author Shiyi Li
Hengzhen Feng
Wenzhong Lou
Yuecen Zhao
Sining Lv
Wenxing Kan
author_facet Shiyi Li
Hengzhen Feng
Wenzhong Lou
Yuecen Zhao
Sining Lv
Wenxing Kan
author_sort Shiyi Li
collection DOAJ
description With the demand for high-safety, high-integration, and lightweight micro- and nano-electronic components, an MEMS electromagnetic energy-releasing component was innovatively designed based on the corona discharge theory. The device subverted the traditional device-level protection method for electromagnetic energy, realizing the innovation of adding a complex circuit system to the integrated chip through micro-nanometer processing technology and enhancing the chip’s size from the centimeter level to the micron level. In this paper, the working performance of the MEMS electromagnetic energy-releasing component was verified through a combination of a simulation, a static experiment, and a dynamic test, and a characterization test of the tested MEMS electromagnetic energy-releasing component was carried out to thoroughly analyze the effect of the MEMS electromagnetic energy-releasing component. The results showed that after the strong electromagnetic pulse injection, the pulse breakdown voltage of the MEMS electromagnetic energy-releasing component increased exponentially in terms of the pulse injection voltage, and the residual pulse current decreased significantly from one-third to one-half of the original, representing a significant protective effect. In a DC environment, the breakdown voltage of the needle–needle structure of the MEMS electromagnetic energy-releasing component was 144 V, and the on-time was about 0.5 ms.
format Article
id doaj-art-81bca016674f4867a9070e03dfd38360
institution Kabale University
issn 1424-8220
language English
publishDate 2025-01-01
publisher MDPI AG
record_format Article
series Sensors
spelling doaj-art-81bca016674f4867a9070e03dfd383602025-01-10T13:21:16ZengMDPI AGSensors1424-82202025-01-0125122110.3390/s25010221Design and Testing of MEMS Component for Electromagnetic Pulse ProtectionShiyi Li0Hengzhen Feng1Wenzhong Lou2Yuecen Zhao3Sining Lv4Wenxing Kan5School of Mechatronical Engineering, Beijing Institute of Technology, Beijing 100081, ChinaSchool of Mechatronical Engineering, Beijing Institute of Technology, Beijing 100081, ChinaSchool of Mechatronical Engineering, Beijing Institute of Technology, Beijing 100081, ChinaDepartment of Micro/Nano Electronics, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, ChinaSchool of Mechatronical Engineering, Beijing Institute of Technology, Beijing 100081, ChinaSchool of Mechatronical Engineering, Beijing Institute of Technology, Beijing 100081, ChinaWith the demand for high-safety, high-integration, and lightweight micro- and nano-electronic components, an MEMS electromagnetic energy-releasing component was innovatively designed based on the corona discharge theory. The device subverted the traditional device-level protection method for electromagnetic energy, realizing the innovation of adding a complex circuit system to the integrated chip through micro-nanometer processing technology and enhancing the chip’s size from the centimeter level to the micron level. In this paper, the working performance of the MEMS electromagnetic energy-releasing component was verified through a combination of a simulation, a static experiment, and a dynamic test, and a characterization test of the tested MEMS electromagnetic energy-releasing component was carried out to thoroughly analyze the effect of the MEMS electromagnetic energy-releasing component. The results showed that after the strong electromagnetic pulse injection, the pulse breakdown voltage of the MEMS electromagnetic energy-releasing component increased exponentially in terms of the pulse injection voltage, and the residual pulse current decreased significantly from one-third to one-half of the original, representing a significant protective effect. In a DC environment, the breakdown voltage of the needle–needle structure of the MEMS electromagnetic energy-releasing component was 144 V, and the on-time was about 0.5 ms.https://www.mdpi.com/1424-8220/25/1/221strong electromagnetic environmentelectromagnetic energy diversionresponse characterizationsafety protectionMEMS
spellingShingle Shiyi Li
Hengzhen Feng
Wenzhong Lou
Yuecen Zhao
Sining Lv
Wenxing Kan
Design and Testing of MEMS Component for Electromagnetic Pulse Protection
Sensors
strong electromagnetic environment
electromagnetic energy diversion
response characterization
safety protection
MEMS
title Design and Testing of MEMS Component for Electromagnetic Pulse Protection
title_full Design and Testing of MEMS Component for Electromagnetic Pulse Protection
title_fullStr Design and Testing of MEMS Component for Electromagnetic Pulse Protection
title_full_unstemmed Design and Testing of MEMS Component for Electromagnetic Pulse Protection
title_short Design and Testing of MEMS Component for Electromagnetic Pulse Protection
title_sort design and testing of mems component for electromagnetic pulse protection
topic strong electromagnetic environment
electromagnetic energy diversion
response characterization
safety protection
MEMS
url https://www.mdpi.com/1424-8220/25/1/221
work_keys_str_mv AT shiyili designandtestingofmemscomponentforelectromagneticpulseprotection
AT hengzhenfeng designandtestingofmemscomponentforelectromagneticpulseprotection
AT wenzhonglou designandtestingofmemscomponentforelectromagneticpulseprotection
AT yuecenzhao designandtestingofmemscomponentforelectromagneticpulseprotection
AT sininglv designandtestingofmemscomponentforelectromagneticpulseprotection
AT wenxingkan designandtestingofmemscomponentforelectromagneticpulseprotection