Amoeba Based Novel Post-Processing Algorithm for Industrial Computed Tomography Scans Enhancement

Amoeba Based Novel Post-Processing Algorithm for Industrial Computed Tomography Scans Enhancement

Industrial Computed Tomography (ICT) for flaw profiling of critical systems is a highly efficient and widely used non-destructive testing (NDT) technique. Prompt image reconstruction is required while scanning industrial components; offering many benefits, such as increased throughput, reduced syst...

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Bibliographic Details
Main Authors: Umar Talha, Waleed Bin Yousuf, Tariq Mairaj
Format: Article
Language:English
Published: Shaheed Zulfikar Ali Bhutto Institute of Science and Technology 2025-06-01
Series:JISR on Computing
Subjects:
Induistrial Computed tomography (ICT),
flaw detection
Crack profiling
Post-processing
Amoeba filtering,
Image processing
Online Access:https://jisrc.szabist.edu.pk/ojs/index.php/jisrc/article/view/217
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https://jisrc.szabist.edu.pk/ojs/index.php/jisrc/article/view/217

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