Crossed Wavelet Convolution Network for Few-Shot Defect Detection of Industrial Chips
In resistive polymer humidity sensors, the quality of the resistor chips directly affects the performance. Detecting chip defects remains challenging due to the scarcity of defective samples, which limits traditional supervised-learning methods requiring abundant labeled data. While few-shot learnin...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-07-01
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| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/25/14/4377 |
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