Efficient microstructure segmentation in three-dimensional imaging: Combining few-shot learning with the segment anything modelEarth/Chem
The application of three-dimensional (3D) imaging techniques, such as X-ray tomography and focussed ion beam scanning electron microscopy (FIB-SEM), is increasingly widespread in microstructural analysis of natural materials. However, our ability to collect high-resolution tomographic datasets, each...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2025-07-01
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| Series: | Next Materials |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2949822825001819 |
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