Determination of electrical parameters of individual multiwalled carbon nanotube using scanning probe microscopy techniques
Based on the combination of conductive atomic force microscopy (C-AFM) and electrostatic force microscopy (EFM), the electrical parameters of undoped, nitrogen- and boron-doped individual multiwalled carbon nanotubes (CNTs) have been determined. The longitudinal electric resistance of CNTs is ob...
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| Format: | Article |
| Language: | English |
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Omsk State Technical University, Federal State Autonoumos Educational Institution of Higher Education
2018-07-01
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| Series: | Омский научный вестник |
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| Online Access: | https://www.omgtu.ru/general_information/media_omgtu/journal_of_omsk_research_journal/files/arhiv/2018/3%20(159)/114-117%20%D0%A1%D0%BE%D0%BA%D0%BE%D0%BB%D0%BE%D0%B2%20%D0%94.%20%D0%92.,%20%D0%94%D0%B0%D0%B2%D0%BB%D0%B5%D1%82%D0%BA%D0%B8%D0%BB%D1%8C%D0%B4%D0%B5%D0%B5%D0%B2%20%D0%9D.%20%D0%90.,%20%D0%9B%D0%BE%D0%B1%D0%BE%D0%B2%20%D0%98.%20%D0%90..pdf |
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| _version_ | 1832569467298643968 |
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| author | D. V. Sokolov N. A. Davletkildeev I. A. Lobov |
| author_facet | D. V. Sokolov N. A. Davletkildeev I. A. Lobov |
| author_sort | D. V. Sokolov |
| collection | DOAJ |
| description | Based on the combination of conductive atomic force microscopy
(C-AFM) and electrostatic force microscopy (EFM), the electrical
parameters of undoped, nitrogen- and boron-doped individual
multiwalled carbon nanotubes (CNTs) have been determined. The
longitudinal electric resistance of CNTs is obtained using C-AFM.
The determination of diameter, length and work function in CNT is based on the analysis of EFM data. Using two techniques of
scanning probe microscopy, electrical conductivity, free carriers
concentration, carriers mobility of individual multiwalled CNT are
evaluated. |
| format | Article |
| id | doaj-art-7dd7fe8aa83e4919ba34f304b9640ea6 |
| institution | Kabale University |
| issn | 1813-8225 2541-7541 |
| language | English |
| publishDate | 2018-07-01 |
| publisher | Omsk State Technical University, Federal State Autonoumos Educational Institution of Higher Education |
| record_format | Article |
| series | Омский научный вестник |
| spelling | doaj-art-7dd7fe8aa83e4919ba34f304b9640ea62025-02-02T21:27:07ZengOmsk State Technical University, Federal State Autonoumos Educational Institution of Higher EducationОмский научный вестник1813-82252541-75412018-07-013 (159)11411710.25206/1813-8225-2018-159-114-117Determination of electrical parameters of individual multiwalled carbon nanotube using scanning probe microscopy techniquesD. V. Sokolov0N. A. Davletkildeev1I. A. Lobov2Omsk Scientific Center of the Siberian Branchof the Russian Academy of SciencesOmsk Scientific Center of the Siberian Branchof the Russian Academy of SciencesOmsk Scientific Center of the Siberian Branchof the Russian Academy of SciencesBased on the combination of conductive atomic force microscopy (C-AFM) and electrostatic force microscopy (EFM), the electrical parameters of undoped, nitrogen- and boron-doped individual multiwalled carbon nanotubes (CNTs) have been determined. The longitudinal electric resistance of CNTs is obtained using C-AFM. The determination of diameter, length and work function in CNT is based on the analysis of EFM data. Using two techniques of scanning probe microscopy, electrical conductivity, free carriers concentration, carriers mobility of individual multiwalled CNT are evaluated.https://www.omgtu.ru/general_information/media_omgtu/journal_of_omsk_research_journal/files/arhiv/2018/3%20(159)/114-117%20%D0%A1%D0%BE%D0%BA%D0%BE%D0%BB%D0%BE%D0%B2%20%D0%94.%20%D0%92.,%20%D0%94%D0%B0%D0%B2%D0%BB%D0%B5%D1%82%D0%BA%D0%B8%D0%BB%D1%8C%D0%B4%D0%B5%D0%B5%D0%B2%20%D0%9D.%20%D0%90.,%20%D0%9B%D0%BE%D0%B1%D0%BE%D0%B2%20%D0%98.%20%D0%90..pdfcarbon nanotubesconductive atomic force microscopyelectrostatic force microscopyelectrical parameterswork functionconductivity |
| spellingShingle | D. V. Sokolov N. A. Davletkildeev I. A. Lobov Determination of electrical parameters of individual multiwalled carbon nanotube using scanning probe microscopy techniques Омский научный вестник carbon nanotubes conductive atomic force microscopy electrostatic force microscopy electrical parameters work function conductivity |
| title | Determination of electrical parameters of individual multiwalled carbon nanotube using scanning probe microscopy techniques |
| title_full | Determination of electrical parameters of individual multiwalled carbon nanotube using scanning probe microscopy techniques |
| title_fullStr | Determination of electrical parameters of individual multiwalled carbon nanotube using scanning probe microscopy techniques |
| title_full_unstemmed | Determination of electrical parameters of individual multiwalled carbon nanotube using scanning probe microscopy techniques |
| title_short | Determination of electrical parameters of individual multiwalled carbon nanotube using scanning probe microscopy techniques |
| title_sort | determination of electrical parameters of individual multiwalled carbon nanotube using scanning probe microscopy techniques |
| topic | carbon nanotubes conductive atomic force microscopy electrostatic force microscopy electrical parameters work function conductivity |
| url | https://www.omgtu.ru/general_information/media_omgtu/journal_of_omsk_research_journal/files/arhiv/2018/3%20(159)/114-117%20%D0%A1%D0%BE%D0%BA%D0%BE%D0%BB%D0%BE%D0%B2%20%D0%94.%20%D0%92.,%20%D0%94%D0%B0%D0%B2%D0%BB%D0%B5%D1%82%D0%BA%D0%B8%D0%BB%D1%8C%D0%B4%D0%B5%D0%B5%D0%B2%20%D0%9D.%20%D0%90.,%20%D0%9B%D0%BE%D0%B1%D0%BE%D0%B2%20%D0%98.%20%D0%90..pdf |
| work_keys_str_mv | AT dvsokolov determinationofelectricalparametersofindividualmultiwalledcarbonnanotubeusingscanningprobemicroscopytechniques AT nadavletkildeev determinationofelectricalparametersofindividualmultiwalledcarbonnanotubeusingscanningprobemicroscopytechniques AT ialobov determinationofelectricalparametersofindividualmultiwalledcarbonnanotubeusingscanningprobemicroscopytechniques |