Investigating the polarized emission of P3HT films and the role of GO in the interfacial layer

Investigating the polarized emission of P3HT films and the role of GO in the interfacial layer

In this work, P3HT:PCBM films were deposited on PEDOT:PSS and PEDOT:PSS:GO buffer layers, aiming to evaluate the impact of graphene oxide (GO) on photophysical properties using emission ellipsometry (EE). The characterization, involving Ultraviolet-Visible Absorption Spectroscopy (UV-Vis), Photolumi...

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Bibliographic Details
Main Authors: Aleffe Bruno Schura, Ana Clarissa H. Kolbow, Everton Crestani Rambo, Gustavo Gonçalves Dalkiranis, Cássio Araújo do Nascimento, Romildo Jerônimo Ramos, Alexandre Marletta, Luiz Pereira, José Carlos Germino, Eralci Moreira Therézio
Format: Article
Language:English
Published: Elsevier 2025-10-01
Series:Next Materials
Subjects:
Emission ellipsometry
Graphene oxide
Optical properties
Online Access:http://www.sciencedirect.com/science/article/pii/S2949822825004940
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http://www.sciencedirect.com/science/article/pii/S2949822825004940

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