Modeling the Increase in Effective Mobility in Short-Channel Oxide Thin-Film Transistors

This paper investigates the dependence of effective carrier mobility on the channel length in oxide thin-film transistors (TFTs). Bottom-gate staggered TFTs fabricated with a sputtered indium-galliumzinc-oxide channel exhibit a substantial increase in field-effect mobility with decreasing channel le...

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Bibliographic Details
Main Authors: Oliver Durnan, Reem Alshanbari, Hong-Rae Cho, Ioannis Kymissis, Chang-Hyun Kim
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10948409/
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