Research on variable-length control chart pattern recognition based on sliding window method and SECNN-BiLSTM

Research on variable-length control chart pattern recognition based on sliding window method and SECNN-BiLSTM

Abstract Control charts, as essential tools in Statistical Process Control (SPC), are frequently used to analyze whether production processes are under control. Most existing control chart recognition methods target fixed-length data, failing to meet the needs of recognizing variable-length control...

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Bibliographic Details
Main Authors: Tao Zan, Xiaolong Jia, Xiaoyu Guo, Min Wang, Xiangsheng Gao, Peng Gao
Format: Article
Language:English
Published: Nature Portfolio 2025-02-01
Series:Scientific Reports
Subjects:
Variable-length control chart
Pattern recognition
Sliding window method
SECNN-BiLSTM
Cloud computing
Online Access:https://doi.org/10.1038/s41598-025-86849-4
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https://doi.org/10.1038/s41598-025-86849-4

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