Numerical Simulation of Damage Processes in CCD Detectors Induced by Multi-Pulse Nanosecond Laser Irradiation
This paper presents a finite element simulation of thermal damage to a CCD caused by nanosecond multi-pulse laser exposure. The temperature changes in the CCD due to the laser pulses were simulated, and the time evolution of thermal damage was studied. The impacts of different laser parameters such...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-08-01
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| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/25/15/4851 |
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