ML-Driven Transistor Self-Heating Analysis From TCAD to Large IP Circuits
To mitigate the increasing short-channel effects of miniaturization, the channel is wrapped increasingly with gate metal and insulating oxides to improve electrostatic control while worsening self-heating. Hence, self-heating has become a reliability concern and will increase in severity with more a...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/11021597/ |
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