Probe device for electrical measurements of parameters thin doped films ZnO
Probe device for electrical measurements of parameters thin doped films ZnO is considered. On the base of use of this probe device there is measured by the Hall E ffect method the concentration of electrons of the conductivity in indium doped thin films ZnO with thickness in the interval (0,065–...
Saved in:
Main Authors: | A. I. Blesman, R. B. Burlakov |
---|---|
Format: | Article |
Language: | English |
Published: |
Omsk State Technical University, Federal State Autonoumos Educational Institution of Higher Education
2020-03-01
|
Series: | Омский научный вестник |
Subjects: | |
Online Access: | https://www.omgtu.ru/general_information/media_omgtu/journal_of_omsk_research_journal/files/arhiv/2020/1%20(169)/67-72%20%D0%91%D0%BB%D0%B5%D1%81%D0%BC%D0%B0%D0%BD%20%D0%90.%20%D0%98.,%20%D0%91%D1%83%D1%80%D0%BB%D0%B0%D0%BA%D0%BE%D0%B2%20%D0%A0.%20%D0%91..pdf |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Enhanced high-energy proton radiation hardness of ZnO thin-film transistors with a passivation layer
by: Yongsu Lee, et al.
Published: (2025-01-01) -
Impact of Mn/Co substitution on magnetoelectric and structural properties of ZnO nanostructures thin films
by: Ángela P. Lanchero, et al.
Published: (2025-02-01) -
Synaptic behaviour in ZnO–rGO composites thin film memristor
by: G.M. Khanal, et al.
Published: (2017-03-01) -
Epitaxial growth of non-polar a-plane ZnO and aluminium-doped ZnO on r-sapphire using the intermittent spray pyrolysis methodology
by: Cerine Treesa Russel, et al.
Published: (2025-01-01) -
Vacuum vaporizer for fabrication of thin films of material by sublimations
by: A. I. Blesman, et al.
Published: (2019-12-01)