Insights Into Design Optimization of Negative Capacitance Complementary-FET (CFET)
This work assesses and analyzes negative-capacitance CFETs (NC-CFETs) with metal-ferroelectric-insulator-semiconductor (MFIS) and metal-ferroelectric-metal-insulator-semiconductor (MFMIS) configurations through experimentally calibrated Landau-Khalatnikov model for an ultrathin (1.5 nm) single-cryst...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Journal of the Electron Devices Society |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10906432/ |
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