A Low-Power LTPO Scan Driver Circuit Using DC Power Supplied Buffer

A Low-Power LTPO Scan Driver Circuit Using DC Power Supplied Buffer

This paper proposes a novel low-temperature polycrystalline silicon and oxide (LTPO) scan driver circuit integrating p-channel low-temperature polycrystalline silicon (LTPS) thin-film transistors (TFTs) and n-channel metal-oxide (MOx) TFTs. The proposed circuit employs a complementary metal-oxide-se...

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Bibliographic Details
Main Authors: SangWoon Lee, JungSuk Oh, HyeongMin Kim, YiKyoung You, Nack-Hyeon Keum, HeeJu Moon, SangHun Kim, KeeChan Park, Hwarim Im
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Low power
low-temperature polycrystalline silicon oxide backplane
organic light-emitting diode display
positive bias stress
scan driver circuit
Online Access:https://ieeexplore.ieee.org/document/11006837/
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https://ieeexplore.ieee.org/document/11006837/

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