Advanced atomic force microscopy techniques V

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Bibliographic Details
Main Authors:	Philipp Rahe, Ilko Bald, Nadine Hauptmann, Regina Hoffmann-Vogel, Harry Mönig, Michael Reichling
Format:	Article
Language:	English
Published:	Beilstein-Institut 2025-01-01
Series:	Beilstein Journal of Nanotechnology
Subjects:	afm atomic force microscopy conductivity drift correction force spectroscopy nc-afm non-contact atomic force microscopy resistivity tip–surface interaction
Online Access:	https://doi.org/10.3762/bjnano.16.6
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https://doi.org/10.3762/bjnano.16.6