A Lightweight Laser Chip Defect Detection Algorithm Based on Improved YOLOv7-Tiny
[Purposes] Catastrophic Optical Damage (COD) is a major limiting factor for the reliability and lifespan of high-power semiconductor lasers, making effective defect detection crucial for optimizing the manufacturing processes and structural designs of laser chips. In this study, a lightweight laser...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Editorial Office of Journal of Taiyuan University of Technology
2025-01-01
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| Series: | Taiyuan Ligong Daxue xuebao |
| Subjects: | |
| Online Access: | https://tyutjournal.tyut.edu.cn/englishpaper/show-2373.html |
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