Application of Split-frequency AVO Technology in the Evaluation of Middle-depth Thin Reservoirs in the Xihu Depression

Owing to the combination of factors such as the thin layer structure, thickness, and fluid, the wave field characteristics of the thin layer are relatively complex, which results in large uncertainties in the thin layer AVO analysis. To address the complex thin layer simulation problem, this study u...

Full description

Saved in:
Bibliographic Details
Main Authors: Yangsen LI, Wei WANG, Bingying LI, Yunxin MAO, Xiaohui LIU
Format: Article
Language:English
Published: Editorial Office of Computerized Tomography Theory and Application 2025-05-01
Series:CT Lilun yu yingyong yanjiu
Subjects:
Online Access:https://www.cttacn.org.cn/cn/article/doi/10.15953/j.ctta.2024.223
Tags: Add Tag
No Tags, Be the first to tag this record!