A method for IoT devices test case generation using language models

The rapid growth of IoT and electronic systems has led to complex real-time data processing and management solutions. However, these systems present significant software and hardware testing challenges, often requiring manual, time-consuming testing efforts. To address this, an automated end-to-end...

Full description

Saved in:
Bibliographic Details
Main Authors: Sumit Kumar, Kiran Napte, Ruchi Rani, Sanjeev Kumar Pippal
Format: Article
Language:English
Published: Elsevier 2025-06-01
Series:MethodsX
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2215016125001864
Tags: Add Tag
No Tags, Be the first to tag this record!