Pseudoexhaustive memory testing based on March A type march tests

The relevance of testing of memory devices of modern computing systems is shown. The methods and algorithms for implementing test procedures based on classical March tests are analyzed. Multiple March tests are highlighted to detect complex pattern-sensitive memory faults. To detect them, the necess...

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Bibliographic Details
Main Authors: V. N. Yarmolik, I. Mrozek, S. V. Yarmolik
Format: Article
Language:Russian
Published: National Academy of Sciences of Belarus, the United Institute of Informatics Problems 2020-06-01
Series:Informatika
Subjects:
Online Access:https://inf.grid.by/jour/article/view/1050
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