Screening of <i>Stb</i> leaf blotch resistance genes of the common wheat varieties

Currently, leaf blotch is one of the main problems in wheat production around the world. The use of DNA markers for screening a large amount of breeding material makes it possible to identify wheat leaf blotch resistance genes quickly and accurately. In this regard, the Federal Agricultural Research...

Full description

Saved in:
Bibliographic Details
Main Authors: N. V. Novoselova, A. V. Kharina, E. A. Bessolitsina, L. S. Savintseva
Format: Article
Language:Russian
Published: Federal State Budgetary Scientific Institution “Agricultural Research Center “Donskoy”" 2023-06-01
Series:Зерновое хозяйство России
Subjects:
Online Access:https://www.zhros.online/jour/article/view/2303
Tags: Add Tag
No Tags, Be the first to tag this record!