Features of Influence of X-radiation and Magnetic Field on the Electrical Characteristics of Barrier Structures Based on p-Si with Dislocation, Designed for Solar Energy
This paper reviews the influence of low doses X-rays (D < 400 Gy) and weak magnetic field (B = 0.17 T) on the I-V and C-V characteristics changes of surface-barrier Bi-Si-Al structures based on p-Si crystals with dislocation concentration > 102 cm – 2 in the surface layer of silicon. The charg...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Sumy State University
2015-12-01
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| Series: | Журнал нано- та електронної фізики |
| Subjects: | |
| Online Access: | http://jnep.sumdu.edu.ua/download/numbers/2015/4/articles/jnep_2015_V7_04051.doc |
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