Features of Influence of X-radiation and Magnetic Field on the Electrical Characteristics of Barrier Structures Based on p-Si with Dislocation, Designed for Solar Energy

This paper reviews the influence of low doses X-rays (D < 400 Gy) and weak magnetic field (B = 0.17 T) on the I-V and C-V characteristics changes of surface-barrier Bi-Si-Al structures based on p-Si crystals with dislocation concentration > 102 cm – 2 in the surface layer of silicon. The charg...

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Bibliographic Details
Main Authors: D.P. Slobodzyan, B.V. Pavlyk, M.O. Kushlyk
Format: Article
Language:English
Published: Sumy State University 2015-12-01
Series:Журнал нано- та електронної фізики
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Online Access:http://jnep.sumdu.edu.ua/download/numbers/2015/4/articles/jnep_2015_V7_04051.doc
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