Dynamic Partial Reconfiguration Project for the Anti-single Event Effect Based on the Soft Error Mitigation
With the wide application of FPGA(field programmable gate array) based on the SRAM(static randomaccess memory) in the aerospace field, the probability of SEU(single event upset) increases gradually while the FPGAs are exposed in irradiation environment, which may lead to the problems on single event...
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| Main Author: | |
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| Format: | Article |
| Language: | English |
| Published: |
Editorial Department of Journal of Nantong University (Natural Science Edition)
2020-03-01
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| Series: | Nantong Daxue xuebao. Ziran kexue ban |
| Subjects: | |
| Online Access: | https://ngzk.cbpt.cnki.net/portal/journal/portal/client/paper/NGZK_34158e7d-17cc-4e6c-9be1-a846827b0344 |
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