Nonlinear Modeling of a Piezoelectric Actuator-Driven High-Speed Atomic Force Microscope Scanner Using a Variant DenseNet-Type Neural Network

Nonlinear Modeling of a Piezoelectric Actuator-Driven High-Speed Atomic Force Microscope Scanner Using a Variant DenseNet-Type Neural Network

Piezoelectric actuators (PEAs) are extensively used for scanning and positioning in scanning probe microscopy (SPM) due to their high precision, simple construction, and fast response. However, there are significant challenges for instrument designers due to their nonlinear properties. Nonlinear pro...

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Bibliographic Details
Main Authors: Thi Thu Nguyen, Luke Oduor Otieno, Oyoo Michael Juma, Thi Ngoc Nguyen, Yong Joong Lee
Format: Article
Language:English
Published: MDPI AG 2024-10-01
Series:Actuators
Subjects:
high-speed atomic force microscopy (HS-AFM)
hysteresis
nonlinear system
DenseNet-type neural network
Online Access:https://www.mdpi.com/2076-0825/13/10/391
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