Near-field refractometry of van der Waals crystals
Common techniques for measuring refractive indices, such as ellipsometry and goniometry, are ineffective for van der Waals crystal flakes because of their high anisotropy and small, micron-scale, lateral size. To address this, we employ near-field optical microscopy to analyze the guided optical mod...
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| Format: | Article |
| Language: | English |
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De Gruyter
2025-05-01
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| Series: | Nanophotonics |
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| Online Access: | https://doi.org/10.1515/nanoph-2025-0117 |
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| _version_ | 1849429543395262464 |
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| author | Nørgaard Martin Yezekyan Torgom Rolfs Stefan Frydendahl Christian Mortensen N. Asger Zenin Vladimir A. |
| author_facet | Nørgaard Martin Yezekyan Torgom Rolfs Stefan Frydendahl Christian Mortensen N. Asger Zenin Vladimir A. |
| author_sort | Nørgaard Martin |
| collection | DOAJ |
| description | Common techniques for measuring refractive indices, such as ellipsometry and goniometry, are ineffective for van der Waals crystal flakes because of their high anisotropy and small, micron-scale, lateral size. To address this, we employ near-field optical microscopy to analyze the guided optical modes within these crystals. By probing these modes in MoS2 flakes with subwavelength spatial resolution at a wavelength of 1,570 nm, we determine both the in-plane and out-of-plane permittivity components of MoS2 as 16.11 and 6.25, respectively, with a relative uncertainty below 1 %, while overcoming the limitations of traditional methods. |
| format | Article |
| id | doaj-art-68a72ec341ff4994abcd83422161cdbe |
| institution | Kabale University |
| issn | 2192-8614 |
| language | English |
| publishDate | 2025-05-01 |
| publisher | De Gruyter |
| record_format | Article |
| series | Nanophotonics |
| spelling | doaj-art-68a72ec341ff4994abcd83422161cdbe2025-08-20T03:28:19ZengDe GruyterNanophotonics2192-86142025-05-0114142473248310.1515/nanoph-2025-0117Near-field refractometry of van der Waals crystalsNørgaard Martin0Yezekyan Torgom1Rolfs Stefan2Frydendahl Christian3Mortensen N. Asger4Zenin Vladimir A.5POLIMA – Center for Polariton-driven Light– Matter Interactions, 594932University of Southern Denmark, Campusvej 55, DK-5230, Odense M, DenmarkPOLIMA – Center for Polariton-driven Light– Matter Interactions, 594932University of Southern Denmark, Campusvej 55, DK-5230, Odense M, DenmarkCenter for Nano Optics, University of Southern Denmark, Campusvej 55, DK-5230, Odense M, DenmarkCenter for Nano Optics, University of Southern Denmark, Campusvej 55, DK-5230, Odense M, DenmarkPOLIMA – Center for Polariton-driven Light– Matter Interactions, 594932University of Southern Denmark, Campusvej 55, DK-5230, Odense M, DenmarkCenter for Nano Optics, University of Southern Denmark, Campusvej 55, DK-5230, Odense M, DenmarkCommon techniques for measuring refractive indices, such as ellipsometry and goniometry, are ineffective for van der Waals crystal flakes because of their high anisotropy and small, micron-scale, lateral size. To address this, we employ near-field optical microscopy to analyze the guided optical modes within these crystals. By probing these modes in MoS2 flakes with subwavelength spatial resolution at a wavelength of 1,570 nm, we determine both the in-plane and out-of-plane permittivity components of MoS2 as 16.11 and 6.25, respectively, with a relative uncertainty below 1 %, while overcoming the limitations of traditional methods.https://doi.org/10.1515/nanoph-2025-0117snomvdw crystalsrefractive index |
| spellingShingle | Nørgaard Martin Yezekyan Torgom Rolfs Stefan Frydendahl Christian Mortensen N. Asger Zenin Vladimir A. Near-field refractometry of van der Waals crystals Nanophotonics snom vdw crystals refractive index |
| title | Near-field refractometry of van der Waals crystals |
| title_full | Near-field refractometry of van der Waals crystals |
| title_fullStr | Near-field refractometry of van der Waals crystals |
| title_full_unstemmed | Near-field refractometry of van der Waals crystals |
| title_short | Near-field refractometry of van der Waals crystals |
| title_sort | near field refractometry of van der waals crystals |
| topic | snom vdw crystals refractive index |
| url | https://doi.org/10.1515/nanoph-2025-0117 |
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