Near-field refractometry of van der Waals crystals
Common techniques for measuring refractive indices, such as ellipsometry and goniometry, are ineffective for van der Waals crystal flakes because of their high anisotropy and small, micron-scale, lateral size. To address this, we employ near-field optical microscopy to analyze the guided optical mod...
Saved in:
| Main Authors: | , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
De Gruyter
2025-05-01
|
| Series: | Nanophotonics |
| Subjects: | |
| Online Access: | https://doi.org/10.1515/nanoph-2025-0117 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|