Correction: Application of Mask R-CNN and YOLOv8 algorithms for defect detection in printed circuit board manufacturing
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Springer
2025-04-01
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| Series: | Discover Applied Sciences |
| Online Access: | https://doi.org/10.1007/s42452-025-06802-y |
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