High-order near-field imaging of low-dimensional materials at infrared wavelengths
Abstract Near-field imaging provides insight into the fundamental light-matter interactions on a nanometer scale. Scattering-type scanning near-field optical microscopy (s-SNOM) is a powerful technique capable of overcoming the diffraction limit and achieving spatial resolutions below 10 nm (sub-10...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
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Nature Publishing Group
2025-06-01
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| Series: | Microsystems & Nanoengineering |
| Online Access: | https://doi.org/10.1038/s41378-025-00953-z |
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| _version_ | 1850138007935385600 |
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| author | Shuhao Zhao Peirui Ji Fei Wang Shaobo Li Guofeng Zhang Tao Liu Shuming Yang |
| author_facet | Shuhao Zhao Peirui Ji Fei Wang Shaobo Li Guofeng Zhang Tao Liu Shuming Yang |
| author_sort | Shuhao Zhao |
| collection | DOAJ |
| description | Abstract Near-field imaging provides insight into the fundamental light-matter interactions on a nanometer scale. Scattering-type scanning near-field optical microscopy (s-SNOM) is a powerful technique capable of overcoming the diffraction limit and achieving spatial resolutions below 10 nm (sub-10 nm). However, constrained by the working mechanisms, the signal-to-noise ratio of the imaging is highly affected by undesired background scattering light, which is found to be associated with the optical mode and excitation wavelength, especially for samples with a large specific surface area. Here, we propose a high-resolution method with high-order near-field modes at the infrared range to measure low-dimensional materials. With this technique, we reveal the excitation and propagation of the surface plasmon polaritons in graphene and carbon nanotubes, which was impossible with the low-order imaging approach. Besides, the imaging quality for gold nanoparticles on gold thin film is much better than the AFM results. This paper offers an advanced approach for high-resolution measurement of low-dimensional materials with s-SNOM, owning great potential for sensitive nanoscale imaging. |
| format | Article |
| id | doaj-art-648d041aea024aad8daf21641c6b368b |
| institution | OA Journals |
| issn | 2055-7434 |
| language | English |
| publishDate | 2025-06-01 |
| publisher | Nature Publishing Group |
| record_format | Article |
| series | Microsystems & Nanoengineering |
| spelling | doaj-art-648d041aea024aad8daf21641c6b368b2025-08-20T02:30:42ZengNature Publishing GroupMicrosystems & Nanoengineering2055-74342025-06-011111910.1038/s41378-025-00953-zHigh-order near-field imaging of low-dimensional materials at infrared wavelengthsShuhao Zhao0Peirui Ji1Fei Wang2Shaobo Li3Guofeng Zhang4Tao Liu5Shuming Yang6State Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong UniversityState Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong UniversityState Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong UniversityState Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong UniversityState Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong UniversityState Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong UniversityState Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong UniversityAbstract Near-field imaging provides insight into the fundamental light-matter interactions on a nanometer scale. Scattering-type scanning near-field optical microscopy (s-SNOM) is a powerful technique capable of overcoming the diffraction limit and achieving spatial resolutions below 10 nm (sub-10 nm). However, constrained by the working mechanisms, the signal-to-noise ratio of the imaging is highly affected by undesired background scattering light, which is found to be associated with the optical mode and excitation wavelength, especially for samples with a large specific surface area. Here, we propose a high-resolution method with high-order near-field modes at the infrared range to measure low-dimensional materials. With this technique, we reveal the excitation and propagation of the surface plasmon polaritons in graphene and carbon nanotubes, which was impossible with the low-order imaging approach. Besides, the imaging quality for gold nanoparticles on gold thin film is much better than the AFM results. This paper offers an advanced approach for high-resolution measurement of low-dimensional materials with s-SNOM, owning great potential for sensitive nanoscale imaging.https://doi.org/10.1038/s41378-025-00953-z |
| spellingShingle | Shuhao Zhao Peirui Ji Fei Wang Shaobo Li Guofeng Zhang Tao Liu Shuming Yang High-order near-field imaging of low-dimensional materials at infrared wavelengths Microsystems & Nanoengineering |
| title | High-order near-field imaging of low-dimensional materials at infrared wavelengths |
| title_full | High-order near-field imaging of low-dimensional materials at infrared wavelengths |
| title_fullStr | High-order near-field imaging of low-dimensional materials at infrared wavelengths |
| title_full_unstemmed | High-order near-field imaging of low-dimensional materials at infrared wavelengths |
| title_short | High-order near-field imaging of low-dimensional materials at infrared wavelengths |
| title_sort | high order near field imaging of low dimensional materials at infrared wavelengths |
| url | https://doi.org/10.1038/s41378-025-00953-z |
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