High-order near-field imaging of low-dimensional materials at infrared wavelengths
Abstract Near-field imaging provides insight into the fundamental light-matter interactions on a nanometer scale. Scattering-type scanning near-field optical microscopy (s-SNOM) is a powerful technique capable of overcoming the diffraction limit and achieving spatial resolutions below 10 nm (sub-10...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Nature Publishing Group
2025-06-01
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| Series: | Microsystems & Nanoengineering |
| Online Access: | https://doi.org/10.1038/s41378-025-00953-z |
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