Single- and multi-locus genome-wide association study reveals genomic regions of thirteen yield-related traits in common wheat

Single- and multi-locus genome-wide association study reveals genomic regions of thirteen yield-related traits in common wheat

Abstract Genetic dissection of yield-related traits can be used to improve wheat yield through molecular design breeding. In this study, we genotyped 245 wheat varieties and measured 13 yield-related plant height-, grain-, and spike-related traits, in seven environments, and identified 778 loci for...

Full description

Saved in:
Bibliographic Details
Main Authors: Yuxia Lv, Liansheng Dong, Xiatong Wang, Linhong Shen, Wenbo Lu, Fan Si, Yaoyao Zhao, Guanju Zhu, Yiting Ding, Shujun Cao, Jiajia Cao, Jie Lu, Chuanxi Ma, Cheng Chang, Haiping Zhang
Format: Article
Language:English
Published: BMC 2024-12-01
Series:BMC Plant Biology
Subjects:
Wheat
Yield
Genome-wide association study
Marker-trait association
Single nucleotide polymorphism
Online Access:https://doi.org/10.1186/s12870-024-05956-y
Tags: Add Tag
No Tags, Be the first to tag this record!

Internet

https://doi.org/10.1186/s12870-024-05956-y

Similar Items