Dynamic atomic-scale electron avalanche breakdown in solid dielectrics

Abstract Electron avalanche breakdown plays a pivotal role in determining the efficiency and reliability of semiconductors and insulators in micro-nanoelectronics and power systems. However, it still remains challenging to understand and control this transient non-equilibrium process. Here, we propo...

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Bibliographic Details
Main Authors: Jian Wang, Zhong-Hui Shen, Wei Li, Run-Lin Liu, Yu-Lin Duan, Yang Shen, Han-Xing Liu, Ce-Wen Nan
Format: Article
Language:English
Published: Nature Portfolio 2025-07-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-025-61866-z
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