APA (7th ed.) Citation

Moreau, C., Lemesle, J., Margarit, D. P., Blateyron, F., & Bigerelle, M. A Statistical Approach for Characterizing the Behaviour of Roughness Parameters Measured by a Multi-Physics Instrument on Ground Surface Topographies: Four Novel Indicators. MDPI AG.

Chicago Style (17th ed.) Citation

Moreau, Clément, Julie Lemesle, David Páez Margarit, François Blateyron, and Maxence Bigerelle. A Statistical Approach for Characterizing the Behaviour of Roughness Parameters Measured by a Multi-Physics Instrument on Ground Surface Topographies: Four Novel Indicators. MDPI AG.

MLA (9th ed.) Citation

Moreau, Clément, et al. A Statistical Approach for Characterizing the Behaviour of Roughness Parameters Measured by a Multi-Physics Instrument on Ground Surface Topographies: Four Novel Indicators. MDPI AG.