A Statistical Approach for Characterizing the Behaviour of Roughness Parameters Measured by a Multi-Physics Instrument on Ground Surface Topographies: Four Novel Indicators

A Statistical Approach for Characterizing the Behaviour of Roughness Parameters Measured by a Multi-Physics Instrument on Ground Surface Topographies: Four Novel Indicators

With a view to improve measurements, this paper presents a statistical approach for characterizing the behaviour of roughness parameters based on measurements performed on ground surface topographies (grit #080/#120). A S neox<sup>TM</sup> (Sensofar<sup>®</sup>, Terrassa, Spa...

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Bibliographic Details
Main Authors: Clément Moreau, Julie Lemesle, David Páez Margarit, François Blateyron, Maxence Bigerelle
Format: Article
Language:English
Published: MDPI AG 2024-11-01
Series:Metrology
Subjects:
roughness parameter family
focus variation
confocal microscope
coherence scanning interferometer
uncertainty
reliability
Online Access:https://www.mdpi.com/2673-8244/4/4/39
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