Research on the influence of epoxy resin on the service life of bond wire in power devices

Power cycling test is the most important test to evaluate the package reliability of power semiconductor devices. Bonding wire failure accounts for approximately 70% of power cycle failure modes. It has been proved that the TO (Transistor Outline) device packaged with epoxy resin has a power cycle l...

Full description

Saved in:
Bibliographic Details
Main Authors: HUA Wenbo, DENG Erping, LIU Peng, NIU Hao, YANG Shaohua, DING Lijian
Format: Article
Language:zho
Published: Editorial Department of Electric Drive for Locomotives 2023-09-01
Series:机车电传动
Subjects:
Online Access:http://edl.csrzic.com/thesisDetails#10.13890/j.issn.1000-128X.2023.05.009
Tags: Add Tag
No Tags, Be the first to tag this record!