Reflectance mapping with microsphere-assisted white light interference nanoscopy
Abstract The characterisation of novel materials presents a challenge that requires new and original developments. To face some of these demands for making measurements at the nanoscale, a new microsphere-assisted white light interference nanoscope performing local reflectance mapping is presented....
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| Main Authors: | Sébastien Marbach, Rémy Claveau, Paul Montgomery, Manuel Flury |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Nature Portfolio
2024-11-01
|
| Series: | Scientific Reports |
| Subjects: | |
| Online Access: | https://doi.org/10.1038/s41598-024-77162-7 |
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