Reflectance mapping with microsphere-assisted white light interference nanoscopy

Abstract The characterisation of novel materials presents a challenge that requires new and original developments. To face some of these demands for making measurements at the nanoscale, a new microsphere-assisted white light interference nanoscope performing local reflectance mapping is presented....

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Bibliographic Details
Main Authors: Sébastien Marbach, Rémy Claveau, Paul Montgomery, Manuel Flury
Format: Article
Language:English
Published: Nature Portfolio 2024-11-01
Series:Scientific Reports
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Online Access:https://doi.org/10.1038/s41598-024-77162-7
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