Study on Single Event Transients in Amplifier for Switched-Capacitor Circuits in CMOS Technology

Study on Single Event Transients in Amplifier for Switched-Capacitor Circuits in CMOS Technology

This article presents a comprehensive analysis of the sensitivity of different switched-capacitor amplifier circuits to Single Event Transients (SETs). SETs are temporary variations in circuit output voltage or current caused by the interaction of heavy ions or high-energy protons with sensitive dev...

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Bibliographic Details
Main Authors: Ming Yan, Jaime Cardenas Chavez, Adriana Noguera Cundar, Kamal El-Sankary, Li Chen
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Access
Subjects:
CMOS technology
nanoscale CMOS
operational amplifier
op-amp
ring amplifier
RAMP
Online Access:https://ieeexplore.ieee.org/document/10852324/
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