Formal description model and conditions for detecting linked coupling faults of the memory devices

Objectives. The aim of the work is to develop and analyze a formal model for describing complex linked coupling faults of memory devices and to formulate the necessary and sufficient conditions for their detection. The relevance of these studies lies in the fact that modern memory devices, character...

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Bibliographic Details
Main Authors: V. N. Yarmolik, D. V. Demenkovets, V. V. Petrovskaya, A. A. Ivaniuk
Format: Article
Language:Russian
Published: National Academy of Sciences of Belarus, the United Institute of Informatics Problems 2023-12-01
Series:Informatika
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Online Access:https://inf.grid.by/jour/article/view/1253
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