An X-Ray Technique for Evaluating the Structure of Films for Device Applications
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Main Authors: | , |
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Format: | Article |
Language: | English |
Published: |
Wiley
1978-01-01
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Series: | Active and Passive Electronic Components |
Online Access: | http://dx.doi.org/10.1155/APEC.5.107 |
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_version_ | 1832547509090648064 |
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author | Ian N. Court R. N. Clarke |
author_facet | Ian N. Court R. N. Clarke |
author_sort | Ian N. Court |
collection | DOAJ |
format | Article |
id | doaj-art-58b01a6b6b9349358fd6c4beee2e17cc |
institution | Kabale University |
issn | 0882-7516 1563-5031 |
language | English |
publishDate | 1978-01-01 |
publisher | Wiley |
record_format | Article |
series | Active and Passive Electronic Components |
spelling | doaj-art-58b01a6b6b9349358fd6c4beee2e17cc2025-02-03T06:44:33ZengWileyActive and Passive Electronic Components0882-75161563-50311978-01-015210711210.1155/APEC.5.107An X-Ray Technique for Evaluating the Structure of Films for Device ApplicationsIan N. CourtR. N. Clarkehttp://dx.doi.org/10.1155/APEC.5.107 |
spellingShingle | Ian N. Court R. N. Clarke An X-Ray Technique for Evaluating the Structure of Films for Device Applications Active and Passive Electronic Components |
title | An X-Ray Technique for Evaluating the Structure of Films for Device Applications |
title_full | An X-Ray Technique for Evaluating the Structure of Films for Device Applications |
title_fullStr | An X-Ray Technique for Evaluating the Structure of Films for Device Applications |
title_full_unstemmed | An X-Ray Technique for Evaluating the Structure of Films for Device Applications |
title_short | An X-Ray Technique for Evaluating the Structure of Films for Device Applications |
title_sort | x ray technique for evaluating the structure of films for device applications |
url | http://dx.doi.org/10.1155/APEC.5.107 |
work_keys_str_mv | AT ianncourt anxraytechniqueforevaluatingthestructureoffilmsfordeviceapplications AT rnclarke anxraytechniqueforevaluatingthestructureoffilmsfordeviceapplications AT ianncourt xraytechniqueforevaluatingthestructureoffilmsfordeviceapplications AT rnclarke xraytechniqueforevaluatingthestructureoffilmsfordeviceapplications |