An X-Ray Technique for Evaluating the Structure of Films for Device Applications

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Bibliographic Details
Main Authors: Ian N. Court, R. N. Clarke
Format: Article
Language:English
Published: Wiley 1978-01-01
Series:Active and Passive Electronic Components
Online Access:http://dx.doi.org/10.1155/APEC.5.107
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author Ian N. Court
R. N. Clarke
author_facet Ian N. Court
R. N. Clarke
author_sort Ian N. Court
collection DOAJ
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institution Kabale University
issn 0882-7516
1563-5031
language English
publishDate 1978-01-01
publisher Wiley
record_format Article
series Active and Passive Electronic Components
spelling doaj-art-58b01a6b6b9349358fd6c4beee2e17cc2025-02-03T06:44:33ZengWileyActive and Passive Electronic Components0882-75161563-50311978-01-015210711210.1155/APEC.5.107An X-Ray Technique for Evaluating the Structure of Films for Device ApplicationsIan N. CourtR. N. Clarkehttp://dx.doi.org/10.1155/APEC.5.107
spellingShingle Ian N. Court
R. N. Clarke
An X-Ray Technique for Evaluating the Structure of Films for Device Applications
Active and Passive Electronic Components
title An X-Ray Technique for Evaluating the Structure of Films for Device Applications
title_full An X-Ray Technique for Evaluating the Structure of Films for Device Applications
title_fullStr An X-Ray Technique for Evaluating the Structure of Films for Device Applications
title_full_unstemmed An X-Ray Technique for Evaluating the Structure of Films for Device Applications
title_short An X-Ray Technique for Evaluating the Structure of Films for Device Applications
title_sort x ray technique for evaluating the structure of films for device applications
url http://dx.doi.org/10.1155/APEC.5.107
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AT rnclarke anxraytechniqueforevaluatingthestructureoffilmsfordeviceapplications
AT ianncourt xraytechniqueforevaluatingthestructureoffilmsfordeviceapplications
AT rnclarke xraytechniqueforevaluatingthestructureoffilmsfordeviceapplications