Layered multiple scattering approach to Hard X-ray photoelectron diffraction: theory and application

Layered multiple scattering approach to Hard X-ray photoelectron diffraction: theory and application

Abstract Photoelectron diffraction (PED) is a powerful technique for resolving surface structures with sub-angstrom precision. At high photon energies, angle-resolved photoemission spectroscopy (ARPES) reveals PED effects, often challenged by small cross-sections, momentum transfer, and phonon scatt...

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Main Authors: Trung-Phuc Vo, Olena Tkach, Sylvain Tricot, Didier Sébilleau, Jürgen Braun, Aki Pulkkinen, Aimo Winkelmann, Olena Fedchenko, Yaryna Lytvynenko, Dmitry Vasilyev, Hans-Joachim Elmers, Gerd Schönhense, Ján Minár
Format: Article
Language:English
Published: Nature Portfolio 2025-05-01
Series:npj Computational Materials
Online Access:https://doi.org/10.1038/s41524-025-01653-y
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https://doi.org/10.1038/s41524-025-01653-y

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