TDM Test Scheduler and TAM Optimization Toolkit: An Integrated Framework for Test Processes of DVFS-Based SoCs with Multiple Voltage Islands

The TDM Test Scheduler and TAM Optimization Toolkit is a novel, integrated, and user-friendly solution designed for engineers, researchers, and instructors working in the field of manufacturing tests. It effectively supports test planning for multicore, DVFS-based SoCs with multiple voltage islands,...

Full description

Saved in:
Bibliographic Details
Main Author: Fotios Vartziotis
Format: Article
Language:English
Published: MDPI AG 2025-04-01
Series:Chips
Subjects:
Online Access:https://www.mdpi.com/2674-0729/4/2/17
Tags: Add Tag
No Tags, Be the first to tag this record!