An Improved YOLOv5 Model for Lithographic Hotspot Detection
The gap between the ever-shrinking feature size of integrated circuits and lithographic manufacturing ability is causing unwanted shape deformations of printed layout patterns. The deformation region with problematic imaging, known as a hotspot (HS), should be detected and corrected before mask manu...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-05-01
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| Series: | Micromachines |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2072-666X/16/5/568 |
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