Experiment and Simulation Research on Performance of Single Transistor of CCD On-chip Amplifier Induced by Proton Irradiation
The irradiation-induced performance degradation of CCD (charge coupled device) image sensors is closely related to the performance degradation of MOS (metal oxide semiconductor) transistors in CCD on-chip amplifiers. The damage mechanism and annealing effect of proton irradiation-induced performance...
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| Format: | Article |
| Language: | English |
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Editorial Board of Atomic Energy Science and Technology
2024-11-01
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| Series: | Yuanzineng kexue jishu |
| Subjects: | |
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