APA (7th ed.) Citation

Lange, S., Hartwig, C. E., Er-Raji, O., Schulze, P. S. C., Turek, M., & Borchert, J. Characterization of Ultrathin Layers in Perovskite/TOPCon Tandem Cells With Photoelectron Spectroscopy Utilizing Advanced Data Evaluation Methods. TIB Open Publishing.

Chicago Style (17th ed.) Citation

Lange, Stefan, Carl Eric Hartwig, Oussama Er-Raji, Patricia S. C. Schulze, Marko Turek, and Juliane Borchert. Characterization of Ultrathin Layers in Perovskite/TOPCon Tandem Cells With Photoelectron Spectroscopy Utilizing Advanced Data Evaluation Methods. TIB Open Publishing.

MLA (9th ed.) Citation

Lange, Stefan, et al. Characterization of Ultrathin Layers in Perovskite/TOPCon Tandem Cells With Photoelectron Spectroscopy Utilizing Advanced Data Evaluation Methods. TIB Open Publishing.