Characterization of Ultrathin Layers in Perovskite/TOPCon Tandem Cells With Photoelectron Spectroscopy Utilizing Advanced Data Evaluation Methods

Characterization of Ultrathin Layers in Perovskite/TOPCon Tandem Cells With Photoelectron Spectroscopy Utilizing Advanced Data Evaluation Methods

Next generation solar cells like tunnel oxide passivated contacts (TOPCon) or perovskite/TOPCon tandem solar cells require efficient interface passivation by ultrathin organic or inorganic layers to uncover their true efficiency potential. Especially the microstructure and the Si suboxide content o...

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Bibliographic Details
Main Authors: Stefan Lange, Carl Eric Hartwig, Oussama Er-Raji, Patricia S. C. Schulze, Marko Turek, Juliane Borchert
Format: Article
Language:English
Published: TIB Open Publishing 2024-12-01
Series:SiliconPV Conference Proceedings
Subjects:
Perovskite/Silicon Tandem
Passivation Layer
Photoelectron Spectroscopy
Online Access:https://www.tib-op.org/ojs/index.php/siliconpv/article/view/1325
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https://www.tib-op.org/ojs/index.php/siliconpv/article/view/1325

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