The agronomic mechanism of root lodging resistance and yield stability for sweet corn in response to planting density and nitrogen rates at different planting dates

The agronomic mechanism of root lodging resistance and yield stability for sweet corn in response to planting density and nitrogen rates at different planting dates

A three-cycle field experiment was conducted to investigate the underlying agronomic mechanism on modulating the root lodging resistance and yield stability of sweet corn in response to the planting density and nitrogen rate during different growth seasons. The experiment comprised two factors with...

Full description

Saved in:
Bibliographic Details
Main Authors: Qinggan Liang, Hailong Chang, Hongrong Chen, Qingdan Wu, Yuanxia Qin, Zhuqing Wang, Gang Wang, Xuhui Li, Weiwei Chen, Jiantao Wu, Qinnan Wang, Jianqiang Wang
Format: Article
Language:English
Published: Frontiers Media S.A. 2025-02-01
Series:Frontiers in Plant Science
Subjects:
sweet corn
lodging resistance
yield stability
planting density
nitrogen rate
root system architecture
Online Access:https://www.frontiersin.org/articles/10.3389/fpls.2025.1481033/full
Tags: Add Tag
No Tags, Be the first to tag this record!

Internet

https://www.frontiersin.org/articles/10.3389/fpls.2025.1481033/full

Similar Items