Single event upset and mitigation technique in JLTFET based RF mixer

This work deals with the study of single event effect (SEE) on RF mixer along with the mitigation technique. A 20 nm independent gate Junctionless Tunnel FET JLTFET (IGJLTFET) was first designed and based on its Id-Vg characteristics; RF mixer circuit was constructed using Verilog A code. The RF mix...

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Bibliographic Details
Main Authors: Aishwarya K, Lakshmi B
Format: Article
Language:English
Published: Elsevier 2025-03-01
Series:Results in Engineering
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2590123024020644
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