Investigation of Modal Characteristics of Silicon Nitride Ridge Waveguides for Enhanced Refractive Index Sensing

Investigation of Modal Characteristics of Silicon Nitride Ridge Waveguides for Enhanced Refractive Index Sensing

This paper investigates the wavelength-dependent sensitivity of a ridge waveguide based on a silicon nitride (Si<sub>3</sub>N<sub>4</sub>) platform, combining numerical analysis and experimental validation. In the first part, the modal characteristics of a Si<sub>3</...

Full description

Saved in:
Bibliographic Details
Main Authors: Muhammad A. Butt, Lukasz Kozlowski, Mateusz Słowikowski, Marcin Juchniewicz, Dagmara Drecka, Maciej Filipiak, Michał Golas, Bartłomiej Stonio, Michal Dudek, Ryszard Piramidowicz
Format: Article
Language:English
Published: MDPI AG 2025-01-01
Series:Micromachines
Subjects:
silicon nitride
ridge waveguide
racetrack ring resonator
sensitivity enhancement
effective refractive index
Online Access:https://www.mdpi.com/2072-666X/16/2/119
Tags: Add Tag
No Tags, Be the first to tag this record!

Internet

https://www.mdpi.com/2072-666X/16/2/119

Similar Items