X-ray diffraction analysis of KY3F10 nanoparticles doped with Nd and preliminary studies for its use in high-dose radiation dosimetry
In this work, the structure and microstructure of Nd:KY3F10 nanoparticles was probed using X-ray synchrotron diffraction analysis. Rietveld refinement was applied to obtain cell parameters, atomic positions and atomic displacement factors to be compared with the ones found in literature. X-ray line...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Brazilian Radiation Protection Society (Sociedade Brasileira de Proteção Radiológica, SBPR)
2019-02-01
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| Series: | Brazilian Journal of Radiation Sciences |
| Subjects: | |
| Online Access: | https://bjrs.org.br/revista/index.php/REVISTA/article/view/586 |
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