X-ray diffraction analysis of KY3F10 nanoparticles doped with Nd and preliminary studies for its use in high-dose radiation dosimetry

In this work, the structure and microstructure of Nd:KY3F10 nanoparticles was probed using X-ray synchrotron diffraction analysis. Rietveld refinement was applied to obtain cell parameters, atomic positions and atomic displacement factors to be compared with the ones found in literature. X-ray line...

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Bibliographic Details
Main Authors: Rodrigo Uchida Ichikawa, Horacio Marconi da Silva Matias Dantas Linhares, Andre Santos Barros Silva, Maria Ines Teixeira, Izilda Marcia Ranieri, Xavier Turrillas, Luis Gallego Martinez
Format: Article
Language:English
Published: Brazilian Radiation Protection Society (Sociedade Brasileira de Proteção Radiológica, SBPR) 2019-02-01
Series:Brazilian Journal of Radiation Sciences
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Online Access:https://bjrs.org.br/revista/index.php/REVISTA/article/view/586
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