In situ measurements of thermal and pressure dependent stress in SOG films by phase shifting interferometry

Hydrogen silsesquioxane (HSQ) and Medusa are spin-on-glasses used for several applications and more specifically for electron-beam lithography. To characterize the thermal densification of these resists on silicon, the mean resist film stress was measured in situ as function of temperature up to 600...

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Bibliographic Details
Main Authors: T.M. van den Berg, A. Bosseboeuf, P. Coste, L. Vincent
Format: Article
Language:English
Published: Elsevier 2024-12-01
Series:Micro and Nano Engineering
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Online Access:http://www.sciencedirect.com/science/article/pii/S2590007224000558
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